Showing results: 466 - 480 of 602 items found.
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Model KM 877 -
Kusam Electrical Industries Limited
• VFD V & Hz readings.• Paper White Backlight LCD Display• Record MAX / MIN readings.• Display Hold Function.• Dual Digital Display.• PI & DAR Function.• Autoranging.• Pass /Fail Insulation Resistance Compare function; 12 selectable Preset Values.• LOCK-Test mode for Insulation Resistance & Earth Continuity Test.• BeepJack ™ audible & visible input warning.• Remote Probe for insulation Resistance & Earth Continuity Test.• Functions : DC/AC Voltage , VFD AC Voltage, Insulation Resisitance, Resistance, Earth Continuity Test, Hz Line Level Frequency
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WIT Co., Ltd
It is a simple and convenient item that allows you to search for and replace the test probe at the same time. With needle-nose pliers, when pulling out a pin in a narrow space, excessive force was applied, which could damage the adjacent pin or widen the hole diameter. With our original pulling tool that supports the minimum pitch, you can easily pull out without damaging the adjacent pin.
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LOM-510A -
IET Labs
The Micro-Ohmmeter has 4 digits, 0.02% basic accuracy and 1 resolution. The 4-terminal kelvin measurement connection minimizes lead resistance errors and 80 dB of ac noise rejection provides rock-steady readings even in noisy locations. The micro-ohmmeter comes with rugged 4-terminal test clips and a large selection of optional probes, clips and fixtures allowing attachment to any low-resistance unknown.
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Vertical Space -
SV Probe, Inc.
With our TrioTM vertical and LogicTouchTM fine pitch vertical technologies an interconnect, otherwise known as a space transformer (ST), is used between the printed circuit board and the probe head, transferring the test signal. SV TCL provides a variety of space transformers, each with its own specific benefits and applications. SV TCL offers a number of space transformer options including:
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Sensors -
Foerster Instruments, Incorporated
We offer a comprehensive range of standard and customised sensors, probes and coils for component testing. If the wide selection of standard sensors does not optimally solve your testing task, we offer you an individual new development specially adapted to your testing task. Thanks to our many years of experience, you receive reliable sensor technology for reproducible test results.
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HS-QSD -
HenergySolar
HS-QSD Quick Silicon Discriminator is specially designed for silicon sorting，it can quickly test the silicon type, heavy-dopedt, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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KMF 1 -
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR KMF 1. The KMF 1 search receiver is used according to the step voltage method. The cable line is scanned with two measurement probes that can be dismantled during transport. The battery-operated device is also suitable for locating multiple consecutive sheath faults.* Battery mode* Zero point compensation* accurate location of cable sheath faults* battery test
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CX-T04 -
Shenzhen Chuangxin Instruments Co., Ltd.
This Spring Impact hammer is strictly designed according to IEC60068-2-75, IEC884 and UL1244 GB/T2423.55-2006, GB4706.1, GB8898 and GB7000 standards. It is used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance to IEC\EN, \UL\CSA and other international Standards.
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Maury Microwave Corporation
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
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FS2601 -
FuturePlus Systems
The FS2601 is one of our newest and fastest logic analyzer probes used to test DDR5 memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 UDIMMs running above 4000MT/s.
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FS2600A -
FuturePlus Systems
The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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Medalist i1000 Systems -
Keysight Technologies
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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855 -
TEGAM Inc.
The ideal solution for anyone that needs a hand held, multi-purpose calibrator to perform field or lab tests on temperature probes or thermometers. The 855 meter will simulate, source, measure and record the same thermocouple types as the 850, K-J-T-E, and adds N-B-R-S-G-C-D types. The meter also supports 1000, 100k, 100 RTD''s but does not support thermistor''s.
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Circuit Check, Inc.
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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PCI EmbeddedComputer Systems
The 3U power test module is an ideal solution for evaluating heat dissipation in a rugged conduction cooled VPX cage or chassis. This card is a thermal load in the chassis to evaluate the heat dissipation. The chassis can be monitored with temp sensing probes and or FLIR imaging. Different wattages are selected by setting dip switches. The +5 and 3.3V loads are on the top of the module. The +12V and -12V loads are on the bottom side of the module.
